Danielle Dekker
at cosine BV
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 21, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: X-ray optics, Metrology, X-rays, Silicon, Monte Carlo methods, Ray tracing, Geometrical optics, Optics manufacturing, Performance modeling, Standards development

PROCEEDINGS ARTICLE | September 8, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: X-ray optics, Metrology, Sensors, X-rays, Silicon, Geometrical optics, Algorithm development, X-ray detectors, Optics manufacturing, X-ray characterization

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Wafer-level optics, Mirrors, X-ray optics, Silicon, Spatial resolution, Astronomical imaging, X-ray astronomy, X-ray telescopes, Semiconducting wafers, Optics manufacturing

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