Mr. Danilo M. Silva
at
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Publications (1)

PROCEEDINGS ARTICLE | September 11, 2012
Proc. SPIE. 8413, Speckle 2012: V International Conference on Speckle Metrology
KEYWORDS: Thermography, Speckle, Glasses, Interferometry, Wavefront sensors, Wavefronts, Semiconductor lasers, Speckle pattern, Thermal effects, Charge-coupled devices

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