CONFERENCE PROCEEDINGS
Advanced Search
Dapeng Chen
at Shanghai Institute of Optics
SPIE Involvement:
Author | Student Chapter Secretary
Publications (1)
Proceedings Article | 15 August 2023 Paper
Absolute flatness measurement based on shift-rotation method using the second deviation
Proceedings Volume 12618, 1261836 (2023) https://doi.org/10.1117/12.2678386
KEYWORDS: Wavefront errors, Zernike polynomials, Optical surfaces, Photovoltaics, Wavefronts, Optical components, Free electron lasers, Vibration, Mirrors, Mirror surfaces
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top