Daron Westly
Research Scientist at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10548, Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
KEYWORDS: Spectroscopy, Photonic integrated circuits, Diffraction gratings, Free space, Waveguides, Collimation, Diffraction, Optical fibers, Metrology

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