Mr. Darren M. Stevenson
at Beckman Institute for Advanced Science & Techn
SPIE Involvement:
Author
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Publications (2)

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Lithography, Refractive index, Stereoscopy, Polymers, X-rays, Reflectivity, Image resolution, Photonic crystals, X-ray imaging, Absorption

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Minerals, Statistical analysis, X-ray computed tomography, Image segmentation, X-rays, Image analysis, Tomography, Chemical analysis, Spatial resolution, X-ray imaging

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