Prof. Daryl S. Purcell
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Monochromatic aberrations, Mirrors, Light sources, Moire patterns, Calibration, Interferometry, Projection systems, Ronchi rulings, Phase measurement, Phase shifts

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