Dr. David R. Allanson
at Liverpool John Moores Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 3, 2003
Proc. SPIE. 5145, Microsystems Engineering: Metrology and Inspection III
KEYWORDS: Optical fibers, Thin films, Photodetectors, Light sources, Fiber Bragg gratings, Sensors, Wavelength division multiplexing, Optical testing, Dense wavelength division multiplexing, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top