Prof. David D. Allred
Professor at Brigham Young Univ
SPIE Involvement:
Publications (26)

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12694, 1269404 (2023)
KEYWORDS: Iron, Magnetism, Extreme ultraviolet, Calibration, Spectral calibration, Gold, High harmonic generation, X-rays

Proceedings Article | 2 October 2023 Presentation + Paper
Proceedings Volume 12666, 1266609 (2023)
KEYWORDS: Silicon, Oxides, Contamination, Silicon nitride, Optical surfaces, Silica, Statistical analysis, Linear regression, Spectroscopic ellipsometry, Ellipsometry

Proceedings Article | 3 October 2022 Presentation + Paper
Scott Olsen, Richard Vanfleet, David Allred, Robert Davis
Proceedings Volume 12201, 1220102 (2022)
KEYWORDS: Plasmas, Extreme ultraviolet, Carbon nanotubes, Helium, Microfabrication, Carbon, Systems modeling, MATLAB, Light emitting diodes, Diffraction

Proceedings Article | 31 August 2022 Poster + Presentation + Paper
Proceedings Volume 12181, 121813A (2022)
KEYWORDS: Aluminum, Data modeling, Thin films, Reflectivity, Statistical modeling, Mirrors, Silicon, Oscillators, Oxidation, Spectroscopic ellipsometry, Far ultraviolet, Space observatories, Magnesium fluoride

Proceedings Article | 29 August 2022 Poster + Presentation + Paper
Proceedings Volume 12188, 121884M (2022)
KEYWORDS: Atomic force microscopy, Humidity, Aluminum, Thin films, Lithium, Silicon, Surface roughness, Mirrors

Showing 5 of 26 publications
Conference Committee Involvement (1)
Optical Constants of Materials for UV to X-Ray Wavelengths
4 August 2004 | Denver, Colorado, United States
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