Prof. David D. Allred
Professor at Brigham Young Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10398, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII
KEYWORDS: Observatories, Mirrors, Dry etching, Hydrogen, Reflectivity, Space telescopes, Space mirrors, Extreme ultraviolet, Aluminum, Plasma

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Oxides, Thin films, Data modeling, Sputter deposition, Crystals, Silicon, Reflectivity, Statistical modeling, Thorium, Absorption

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Thin films, Reflection, Silicon, Reflectivity, Diodes, Transmittance, Extreme ultraviolet, Uranium, Thorium, Oxidation

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Thin films, Mirrors, Data modeling, Silicon, Reflectivity, Refraction, Extreme ultraviolet, Extreme ultraviolet lithography, Ruthenium, Oxidation

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Gold, Oxides, Thin films, X-rays, Nickel, Reflectivity, Extreme ultraviolet, Zone plates, Uranium, Absorption

PROCEEDINGS ARTICLE | January 13, 2004
Proc. SPIE. 5193, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications
KEYWORDS: Oxides, Carbon, Reflectors, Thin films, Quartz, X-rays, Nickel, Reflectivity, Uranium, Absorption

Showing 5 of 16 publications
Conference Committee Involvement (1)
Optical Constants of Materials for UV to X-Ray Wavelengths
4 August 2004 | Denver, Colorado, United States
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