Prof. David D. Allred
Professor at Brigham Young Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10398, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII
KEYWORDS: Mirrors, Aluminum, Reflectivity, Space telescopes, Extreme ultraviolet, Observatories, Hydrogen, Plasma, Space mirrors, Dry etching

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Absorption, Thin films, Thorium, Silicon, Oxides, Data modeling, Sputter deposition, Reflectivity, Crystals, Statistical modeling

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Reflectivity, Thorium, Transmittance, Extreme ultraviolet, Reflection, Thin films, Silicon, Uranium, Diodes, Oxidation

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Ruthenium, Reflectivity, Extreme ultraviolet, Refraction, Data modeling, Mirrors, Thin films, Silicon, Extreme ultraviolet lithography, Oxidation

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Uranium, Reflectivity, Oxides, Nickel, Thin films, Gold, X-rays, Extreme ultraviolet, Absorption, Zone plates

PROCEEDINGS ARTICLE | January 13, 2004
Proc. SPIE. 5193, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications
KEYWORDS: Nickel, Reflectivity, Uranium, Oxides, Quartz, X-rays, Carbon, Absorption, Reflectors, Thin films

Showing 5 of 16 publications
Conference Committee Involvement (1)
Optical Constants of Materials for UV to X-Ray Wavelengths
4 August 2004 | Denver, Colorado, United States
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