Prof. David D. Allred
Professor at Brigham Young Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | July 10, 2018
Proc. SPIE. 10699, Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
KEYWORDS: Amorphous silicon, Mirrors, Lithium, Magnesium fluoride, Ultraviolet radiation, Reflectivity, Space mirrors, Aluminum, Earth's atmosphere, Mirror pointing

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10398, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII
KEYWORDS: Observatories, Mirrors, Dry etching, Hydrogen, Reflectivity, Space telescopes, Space mirrors, Extreme ultraviolet, Aluminum, Plasma

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Oxides, Thin films, Data modeling, Sputter deposition, Crystals, Silicon, Reflectivity, Statistical modeling, Thorium, Absorption

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Thin films, Reflection, Silicon, Reflectivity, Diodes, Transmittance, Extreme ultraviolet, Uranium, Thorium, Oxidation

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Gold, Oxides, Thin films, X-rays, Nickel, Reflectivity, Extreme ultraviolet, Zone plates, Uranium, Absorption

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Thin films, Mirrors, Data modeling, Silicon, Reflectivity, Refraction, Extreme ultraviolet, Extreme ultraviolet lithography, Ruthenium, Oxidation

Showing 5 of 17 publications
Conference Committee Involvement (1)
Optical Constants of Materials for UV to X-Ray Wavelengths
4 August 2004 | Denver, Colorado, United States
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