Mr. David E. Beckman
Analyst at Toyon Research Corp
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 9, 2006
Proc. SPIE. 6229, Intelligent Computing: Theory and Applications IV
KEYWORDS: Mathematical modeling, Switches, Switching, Detection and tracking algorithms, Data modeling, Sensors, Databases, Feature extraction, Intelligence systems, Algorithm development

PROCEEDINGS ARTICLE | March 3, 2006
Proc. SPIE. 6124, Optoelectronic Integrated Circuits VIII
KEYWORDS: Transmitters, Eye, Error analysis, Reliability, Computing systems, CMOS technology, Picosecond phenomena, Vertical cavity surface emitting lasers, Connectors, Binary data

PROCEEDINGS ARTICLE | August 9, 2004
Proc. SPIE. 5429, Signal Processing, Sensor Fusion, and Target Recognition XIII
KEYWORDS: Target detection, Radar, Roads, Detection and tracking algorithms, Data modeling, Databases, Kinematics, Monte Carlo methods, Time metrology, Motion models

PROCEEDINGS ARTICLE | September 12, 2003
Proc. SPIE. 5095, Algorithms for Synthetic Aperture Radar Imagery X
KEYWORDS: Target detection, Radar, Detection and tracking algorithms, Data modeling, Sensors, Databases, Synthetic aperture radar, Image segmentation, Image processing, Target recognition

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