Dr. D. Bruce Burckel
at Sandia National Labs
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | September 19, 2018
Proc. SPIE. 10719, Metamaterials, Metadevices, and Metasystems 2018
KEYWORDS: Finite-difference time-domain method, Data modeling, Polarization, Scattering, Silicon, Magnetism, 3D modeling, Split ring resonators, Optical arrays, Optical metamaterials

PROCEEDINGS ARTICLE | September 17, 2018
Proc. SPIE. 10719, Metamaterials, Metadevices, and Metasystems 2018
KEYWORDS: Plasmonics, 3D acquisition, Dielectrics, Interfaces, Magnetism, Wavefronts, 3D modeling, Antennas, Chemical elements, Light-matter interactions

SPIE Journal Paper | August 12, 2016
JM3 Vol. 15 Issue 03
KEYWORDS: Silicon, Transistors, Integrated circuits, Metals, Capacitance, Spine, Semiconducting wafers, Etching, Lithography, Optical lithography

PROCEEDINGS ARTICLE | March 21, 2016
Proc. SPIE. 9779, Advances in Patterning Materials and Processes XXXIII
KEYWORDS: Lithography, Optical lithography, 3D imaging standards, Etching, Dry etching, Metals, Dielectrics, Silicon, Capacitance, Ion implantation, Transistors, Field effect transistors, Plasma etching, Spine, Semiconducting wafers

PROCEEDINGS ARTICLE | September 3, 2015
Proc. SPIE. 9552, Carbon Nanotubes, Graphene, and Emerging 2D Materials for Electronic and Photonic Devices VIII
KEYWORDS: Carbon, Graphene, Sputter deposition, Metals, Nickel, Coating, Interferometry, Transition metals, Photoresist materials, Photoresist developing

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8806, Metamaterials: Fundamentals and Applications VI
KEYWORDS: Gold, Metamaterials, Polymethylmethacrylate, Polymers, Image processing, Ions, Silicon, Scanning electron microscopy, Failure analysis, Projection lithography

Showing 5 of 13 publications
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