Dr. David R. Churchley
at GlaxoSmithKline
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | February 1, 2011
JBO Vol. 16 Issue 02
KEYWORDS: Terahertz radiation, Minerals, Refractive index, Dental caries, Reflection, Statistical analysis, Interfaces, Millimeter wave imaging, Data acquisition, Polishing

PROCEEDINGS ARTICLE | March 6, 2009
Proc. SPIE. 7162, Lasers in Dentistry XV
KEYWORDS: Refractive index, Polishing, Minerals, Millimeter wave imaging, Statistical analysis, Dental caries, Teeth, Interfaces, Terahertz radiation, In vitro testing

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