Dr. David R. Churchley
at GlaxoSmithKline
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 February 2011
JBO Vol. 16 Issue 02
KEYWORDS: Terahertz radiation, Minerals, Refractive index, Dental caries, Reflection, Statistical analysis, Interfaces, Millimeter wave imaging, Data acquisition, Polishing

Proceedings Article | 6 March 2009
Proc. SPIE. 7162, Lasers in Dentistry XV
KEYWORDS: Minerals, Terahertz radiation, Refractive index, Interfaces, Statistical analysis, In vitro testing, Millimeter wave imaging, Dental caries, Teeth, Polishing

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