Dr. David J. Cook
Sr. Director, IPT Lead at
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | February 14, 2008
Proc. SPIE. 6893, Terahertz Technology and Applications
KEYWORDS: Data modeling, Reflection, Sensors, Calibration, Interfaces, Silicon, Coating, Magnetism, Precision measurement, Terahertz radiation

PROCEEDINGS ARTICLE | February 28, 2006
Proc. SPIE. 6100, Solid State Lasers XV: Technology and Devices
KEYWORDS: Telescopes, Continuous wave operation, Gemini Observatory, Mode locking, Crystals, Diagnostics, Adaptive optics, Semiconductor lasers, Sodium, Laser guide stars

PROCEEDINGS ARTICLE | February 23, 2006
Proc. SPIE. 6102, Fiber Lasers III: Technology, Systems, and Applications
KEYWORDS: Fiber amplifiers, Optical amplifiers, Modulation, Polarization, Crystals, Fiber lasers, Semiconductor lasers, Neodymium, Pulsed laser operation, Laser systems engineering

PROCEEDINGS ARTICLE | March 25, 2005
Proc. SPIE. 5732, Quantum Sensing and Nanophotonic Devices II
KEYWORDS: Mirrors, Modulation, LIDAR, Sensors, Spectroscopy, Laser applications, Quantum cascade lasers, Semiconductor lasers, Terahertz radiation, Absorption

PROCEEDINGS ARTICLE | March 23, 2005
Proc. SPIE. 5710, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications IV
KEYWORDS: Mid-IR, Visible radiation, Second-harmonic generation, Lithium, Crystals, Nd:YAG lasers, Laser crystals, Frequency conversion, Semiconducting wafers, Temperature metrology

PROCEEDINGS ARTICLE | June 14, 2004
Proc. SPIE. 5337, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications III
KEYWORDS: Oxides, Second-harmonic generation, Lithium, Electrodes, Crystals, Power supplies, Photoresist materials, Frequency conversion, Semiconducting wafers, Temperature metrology

Showing 5 of 9 publications
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