Dr. David Cuesta-Frau
at Univ Politècnica de València
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Semiconductors, Image segmentation, Image processing, Digital filtering, Particles, Crystals, Image analysis, Scanning electron microscopy, Image filtering, Zinc oxide

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