David A. Dorn
Applied Technology Engineer Manager at Pelco by Schneider Electric
SPIE Involvement:
Conference Chair | Author | Instructor
Publications (13)

PROCEEDINGS ARTICLE | May 18, 2012
Proc. SPIE. 8354, Thermosense: Thermal Infrared Applications XXXIV
KEYWORDS: Staring arrays, Amorphous silicon, Microbolometers, Thermography, Cameras, Calibration, Image sensors, Black bodies, Camera shutters, Information security

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Amorphous silicon, Microbolometers, Nonuniformity corrections, Sun, Cameras, Image processing, Image quality, Image sensors, Black bodies, Camera shutters

PROCEEDINGS ARTICLE | January 28, 2009
Proc. SPIE. 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Sensors, Image processing, Electrons, Charge-coupled devices, Array processing, Performance modeling, Systems modeling

SPIE Conference Volume | August 7, 2008

PROCEEDINGS ARTICLE | February 21, 2007
Proc. SPIE. 6501, Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII
KEYWORDS: CMOS sensors, Light emitting diodes, Imaging systems, Cameras, Sensors, Quantum efficiency, Image sensors, Charge-coupled devices, Electromagnetic coupling, CCD image sensors

Showing 5 of 13 publications
Conference Committee Involvement (3)
High Energy, Optical, and Infrared Detectors for Astronomy IV
27 June 2010 | San Diego, California, United States
High Energy, Optical, and Infrared Detectors for Astronomy
23 June 2008 | Marseille, France
High Energy, Optical, and Infrared Detectors for Astronomy II
24 May 2006 | Orlando, Florida , United States
Course Instructor
SC1079: CMOS Image Sensor Architecture and Design for Scientific and Space Applications
This course provides attendees with an intermediate knowledge of CMOS image sensors and cameras for demanding applications including extremely low light levels, wide scene dynamic range, or harsh environmental conditions (high temperature, radiation exposure, etc.). The course describes recent advances in sensor and pixel architectures as well as the associated processing and software algorithms to achieve the required performance. The course provides examples of high performance image sensors along with the architectures, designs and technologies required to realize them. The current state-of-the-art of the technology is reviewed with a look at areas of research and trends.
SC905: CMOS Imaging Sensor Architecture, Construction, and Applications
This course provides a review of CMOS imager technologies looking at architectures, designs, and applications. Performance differences between different types of CMOS imaging arrays (3T, 4T, 5T, and 6T) are covered. CMOS imager architectures for the pixel design and readout circuitry are presented along with fundamental performance limitations and tradeoffs associated with each configuration. Pixel design layouts and physical stacks are shown for 3T, 4T, 5T, and 6T along with performance impacts associated with layout configurations. Different configurations of readout multiplexers are shown along with associated noise, speed, power, accuracy, and features. System applications are discussed along with system impacts associated with different sensor architectures. The current status of the technology is reviewed with a look at future research and development trends.
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