Dr. David B. Fenner
Principal Research Scientist at Physical Sciences Inc
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 5 May 2009
Proc. SPIE. 7306, Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI
KEYWORDS: Imaging systems, Cameras, Calibration, Blood, Luminescence, Radiotherapy, Chemiluminescence, Prototyping, Toxicology, Clinical trials

Proceedings Article | 13 February 2008
Proc. SPIE. 6875, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII
KEYWORDS: Lithography, Optical lithography, Etching, Crystals, Interfaces, Gallium arsenide, Photoresist materials, Wet etching, Semiconducting wafers, Wafer bonding

Proceedings Article | 24 June 2002
Proc. SPIE. 4806, Complex Mediums III: Beyond Linear Isotropic Dielectrics
KEYWORDS: Oxides, Argon, Chemical species, Image processing, Crystals, Ions, Silicon, Atomic force microscopy, Oxygen, Ion beams

Proceedings Article | 27 December 2001
Proc. SPIE. 4468, Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing
KEYWORDS: Argon, Ions, Silicon, Atomic force microscopy, Oxygen, Ion beams, Sapphire, Silicon carbide, Semiconducting wafers, Oxidation

Proceedings Article | 19 January 1995
Proc. SPIE. 2367, Optical Sensors for Environmental and Chemical Process Monitoring
KEYWORDS: Thin films, FT-IR spectroscopy, Spectroscopy, Dielectrics, Silicon, Reflectivity, Silicon films, Process control, Infrared radiation, Semiconducting wafers

Showing 5 of 7 publications
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