Dr. David S. Flynn
at MacAulay Brown Inc
SPIE Involvement:
Author
Publications (38)

Proceedings Article | 20 May 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Point spread functions, Optical sensors, Sensors, Calibration, Image processing, Error analysis, Image sensors, Quantization, Projection systems, Sensor calibration

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Nonuniformity corrections, Infrared sensors, Data modeling, Sensors, Calibration, Image processing, Time metrology, Black bodies, Projection systems, Sensor calibration

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Point spread functions, Digital signal processing, Sensors, Calibration, Image processing, Field programmable gate arrays, Distortion, Image sensors, Projection systems, Software development

Proceedings Article | 12 September 2003
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Nonuniformity corrections, MATLAB, Cameras, Sensors, Calibration, Image processing, Image sensors, Projection systems, Infrared radiation, Cryogenics

Proceedings Article | 12 September 2003
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Long wavelength infrared, Mid-IR, Cameras, Sensors, Calibration, Error analysis, Distortion, Image sensors, Projection systems, Optical simulations

Showing 5 of 38 publications
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