David Forrai
Senior Engineering Manager at L3 Space & Sensors
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

PROCEEDINGS ARTICLE | June 21, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Infrared sensors, Sensors, Manufacturing, Epitaxy, Semiconducting wafers, Heterojunctions, Superlattices, Sensor technology, Group III-V semiconductors

PROCEEDINGS ARTICLE | June 21, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Infrared sensors, Electronics, Sensors, Infrared technology, Cryogenics, Current controlled current source

PROCEEDINGS ARTICLE | January 21, 2012
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Staring arrays, Data modeling, Sensors, Quantum efficiency, 3D modeling, Infrared radiation, Electromagnetism, Quantum well infrared photodetectors, Diffraction gratings, Absorption

SPIE Journal Paper | June 1, 2011
OE Vol. 50 Issue 06
KEYWORDS: Staring arrays, Sensors, Quantum well infrared photodetectors, Far infrared, Quantum wells, Electrons, Infrared sensors, Doping, Absorption, Quantum efficiency

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Antireflective coatings, Data modeling, Resonators, Sensors, Quantum efficiency, 3D modeling, Autoregressive models, Quantum well infrared photodetectors, Absorption

PROCEEDINGS ARTICLE | May 5, 2010
Proc. SPIE. 7666, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense IX
KEYWORDS: Staring arrays, Thermography, Infrared sensors, Infrared imaging, Imaging systems, Cameras, Sensors, Video, Image enhancement, Cerium

Showing 5 of 22 publications
Conference Committee Involvement (14)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
14 April 2019 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
19 April 2016 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
21 April 2015 | Baltimore, Maryland, United States
Showing 5 of 14 published special sections
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