David Forrai
Senior Principal EO/IR Systems Engineer at Raytheon
SPIE Involvement:
Publications (22)

Proceedings Article | 21 June 2018 Presentation + Paper
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Infrared sensors, Sensors, Manufacturing, Epitaxy, Semiconducting wafers, Heterojunctions, Superlattices, Sensor technology, Group III-V semiconductors

Proceedings Article | 21 June 2017 Presentation
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Infrared sensors, Electronics, Sensors, Infrared technology, Cryogenics, Current controlled current source

Proceedings Article | 21 January 2012 Paper
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Staring arrays, Data modeling, Sensors, Quantum efficiency, 3D modeling, Infrared radiation, Electromagnetism, Quantum well infrared photodetectors, Diffraction gratings, Absorption

SPIE Journal Paper | 1 June 2011
OE Vol. 50 Issue 06
KEYWORDS: Staring arrays, Sensors, Quantum well infrared photodetectors, Far infrared, Quantum wells, Electrons, Infrared sensors, Doping, Absorption, Quantum efficiency

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Antireflective coatings, Data modeling, Resonators, Sensors, Quantum efficiency, 3D modeling, Autoregressive models, Quantum well infrared photodetectors, Absorption

Showing 5 of 22 publications
Conference Committee Involvement (15)
QSIP 2020
5 July 2020 |
QSIP 2018
16 June 2018 |
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
19 April 2016 | Baltimore, Maryland, United States
Showing 5 of 15 Conference Committees
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