David B. Gariepy
President and Sales Representative at Saratoga Data Systems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2005
Proc. SPIE. 5992, 25th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Manufacturing, Optical proximity correction, Analog electronics, Optimization (mathematics), Photomask technology, System on a chip, Resolution enhancement technologies, Ranging, Chemical mechanical planarization

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