David L. Gilblom
CEO at Maxwell-Hiqe Corp
SPIE Involvement:
Publications (14)

Proceedings Article | 17 February 2011 Paper
Proceedings Volume 7875, 787505 (2011) https://doi.org/10.1117/12.873610
KEYWORDS: Photodiodes, Silicon, Semiconducting wafers, Quantum efficiency, Mirrors, Antireflective coatings, CMOS sensors, Sensors, Imaging systems, Coating

Proceedings Article | 7 June 2004 Paper
Proceedings Volume 5301, (2004) https://doi.org/10.1117/12.528427
KEYWORDS: Infrared imaging, Ultraviolet radiation, Photodiodes, Sensors, Thermography, Infrared radiation, Silicon, Image filtering, Visible radiation, Absorption

Proceedings Article | 6 February 2004 Paper
David Gilblom, Sang Keun Yoo, Peter Ventura
Proceedings Volume 5210, (2004) https://doi.org/10.1117/12.506206
KEYWORDS: Sensors, Cameras, Control systems, Image sensors, Photodiodes, Image processing, Analog electronics, Camera shutters, Optical filters, CMOS sensors

Proceedings Article | 10 October 2003 Paper
David Gilblom, Sang Keun Yoo, Peter Ventura
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.498557
KEYWORDS: Sensors, Image sensors, Optical filters, Photodiodes, Cameras, Silicon, Imaging systems, Diodes, Absorption, Signal detection

Proceedings Article | 28 May 1999 Paper
Richard Colbeth, Virgil Cooper, David Gilblom, Richard Harris, Isaias Job, Martin Klausmeier-Brown, Marcel Marc, John Pavkovich, Edward Seppi, Edward Shapiro, Michael Wright, Jiann Yu
Proceedings Volume 3659, (1999) https://doi.org/10.1117/12.349527
KEYWORDS: Imaging systems, X-rays, Sensors, Video, Signal to noise ratio, Receptors, Radiography, Control systems, Spatial frequencies, Fluoroscopy

Showing 5 of 14 publications
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