Dr. David Lin
at GE Global Research
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 June 2014
Proc. SPIE. 9113, Sensors for Extreme Harsh Environments
KEYWORDS: Microelectromechanical systems, Microsystems, Sensors, Reliability, Magnetism, Transducers, Signal processing, Gyroscopes, Environmental sensing, Temperature metrology

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