VCSEL arrays are being considered for use in interconnect applications that require high speed, high bandwidth, high density, and high reliability. In order to better understand the reliability of VCSEL arrays, we initiated an internal project at SUN Microsystems, Inc. In this paper, we present preliminary results of an ongoing accelerated temperature-humidity-bias stress test on VCSEL arrays from several manufacturers. This test revealed no significant differences between the reliability of AlGaAs, oxide confined VCSEL arrays constructed with a trench oxide and mesa for isolation. This test did find that the reliability of arrays needs to be measured on arrays and not be estimated with the data from singulated VCSELs as is a common practice.