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Dr. David K. McElfresh
Principal Research Scientist at Oracle
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Publications (1)
Proceedings Article | 14 March 2005 Paper
VCSEL reliability: a user's perspective
David McElfresh, Leoncio Lopez, Robert Melanson, Dan Vacar
Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.594362
KEYWORDS: Vertical cavity surface emitting lasers, Manufacturing, Reliability, Failure analysis, Oxides, Sun, Microsystems, Humidity, Semiconducting wafers, Ceramics
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