Dr. David A. Mendels
at National Physical Lab
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 15, 2006
Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers
KEYWORDS: Photoelasticity, Calibration, Manufacturing, Interferometry, Optical testing, Finite element methods, Optical calibration, Experimental mechanics, Standards development, Classification systems

PROCEEDINGS ARTICLE | March 23, 2006
Proc. SPIE. 6151, Emerging Lithographic Technologies X
KEYWORDS: Modeling, Lithography, Polymers, Glasses, Interfaces, Solids, Nanoimprint lithography, Chemical elements, Semiconducting wafers, Fluid dynamics

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5532, Interferometry XII: Applications
KEYWORDS: Fringe analysis, Calibration, Reliability, Interferometry, Optical testing, Finite element methods, Standards development, Phase shifts, Diffraction gratings, Reverse modeling

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