Dr. David Necas
at Masaryk Univ
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Optical components, Thin films, Ellipsometry, Refractive index, Data modeling, Silica, Optical properties, Ultraviolet radiation, Reflectivity, Atomic force microscopy, Infrared spectroscopy, Spectrophotometry, Product engineering, Thin film devices, Spectral models, Instrument modeling, Absorption

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Ellipsometry, Refractive index, Data modeling, Silica, Spectroscopy, Silicon, Optical coatings, Infrared spectroscopy, Systems modeling, Instrument modeling

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Refractive index, Electronics, Spectroscopy, Ultraviolet radiation, Dielectrics, Electrons, Infrared spectroscopy, Phonons, Europium, Absorption

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Thin films, Refractive index, Spectroscopy, Gallium arsenide, Imaging spectroscopy, Atomic force microscopy, Data processing, Spectroscopic ellipsometry, Reflectance spectroscopy, Intelligence systems

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Thin films, Ellipsometry, Spectroscopy, Reflectivity, Imaging spectroscopy, CCD cameras, Reflectometry, Spectroscopic ellipsometry, Reflectance spectroscopy, Intelligence systems

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