David Odom
at Univ of California Santa Cruz
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 February 2006
Proc. SPIE. 6065, Computational Imaging IV
KEYWORDS: Super resolution, Statistical analysis, Image processing, Denoising, Error analysis, Electrical engineering, Statistical modeling, Expectation maximization algorithms, 3D image processing, Bandpass filters

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