David Reolon
at Sciences et Techniques Industrielles de la Lumiere
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Microscopes, Sensors, Spectroscopy, Microscopy, Inspection, Interferometry, 3D metrology, Optical interferometry, Fresnel lenses, Visibility

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5252, Optical Fabrication, Testing, and Metrology
KEYWORDS: Optical components, Refractive index, Mirrors, Beam splitters, Light sources, Metrology, Glasses, Spectroscopy, Interferometry, Michelson interferometers

PROCEEDINGS ARTICLE | February 18, 2004
Proc. SPIE. 5249, Optical Design and Engineering
KEYWORDS: Modulation, Imaging systems, Scattering, Scattering media, Interferometers, Sensors, Tomography, Fresnel lenses, Spherical lenses, Optical correlators

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