Mr. David Reolon Profile

Mr. David Reolon

at Sciences et Techniques Industrielles de la Lumiere

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Publications (3)

PROCEEDINGS ARTICLE | August 11, 2008

Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy

Proc. SPIE. 7064, Interferometry XIV: Applications

KEYWORDS: Microscopes, Sensors, Spectroscopy, Microscopy, Inspection, Interferometry, 3D metrology, Optical interferometry, Fresnel lenses, Visibility

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PROCEEDINGS ARTICLE | February 26, 2004

High-resolution metrology of optical components by spectral interferometry

Proc. SPIE. 5252, Optical Fabrication, Testing, and Metrology

KEYWORDS: Optical components, Refractive index, Mirrors, Beam splitters, Light sources, Metrology, Glasses, Spectroscopy, Interferometry, Michelson interferometers

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PROCEEDINGS ARTICLE | February 18, 2004

Temporal analysis of optical complex structures: application to tomography through scattering media

Proc. SPIE. 5249, Optical Design and Engineering

KEYWORDS: Modulation, Imaging systems, Scattering, Scattering media, Interferometers, Sensors, Tomography, Fresnel lenses, Spherical lenses, Optical correlators

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