Dr. David R. Rhiger
Senior Principal Physics Engineer at Raytheon Vision Systems
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Infrared sensors, Sensors, Photons, Diffusion, Quantum efficiency, Signal detection, Superlattices, Temperature metrology

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Long wavelength infrared, Sensors, Quantum efficiency, Capacitance, Diodes, Semiconducting wafers, Superlattices, Laser sintering, Temperature metrology

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Infrared detectors, Thermography, Infrared sensors, Mid-IR, Photodetectors, Sensors, Diffusion, Gallium antimonide, Superlattices, Temperature metrology

PROCEEDINGS ARTICLE | May 7, 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Staring arrays, Long wavelength infrared, Mid-IR, Liquid phase epitaxy, Mercury cadmium telluride, Sensors, Crystals, Silicon, Mercury, Semiconducting wafers

PROCEEDINGS ARTICLE | May 7, 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Staring arrays, Long wavelength infrared, Infrared imaging, Mid-IR, Indium arsenide, Gallium antimonide, Infrared radiation, Semiconducting wafers, Superlattices, Stereolithography

PROCEEDINGS ARTICLE | May 1, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Long wavelength infrared, Mid-IR, Indium arsenide, Quantum efficiency, Photodiodes, Gallium antimonide, Diodes, Semiconducting wafers, Superlattices, Temperature metrology

Showing 5 of 12 publications
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