Dr. David J. Robbins
Technical Leader at QinetiQ
SPIE Involvement:
Publications (10)

Proceedings Article | 27 March 2002 Paper
Robert Kelsall, Zoran Ikonic, Paul Harrison, Stephen Lynch, Robert Bates, Douglas Paul, David Norris, San Liew, Anthony Cullis, David Robbins, Pavel Murzyn, Carl Pidgeon, Donald Arnone, Richard Soref
Proceedings Volume 4654, (2002) https://doi.org/10.1117/12.463846
KEYWORDS: Silicon, Germanium, Quantum wells, Heterojunctions, Electroluminescence, Quantum cascade lasers, Terahertz radiation, Transmission electron microscopy, FT-IR spectroscopy, Spectroscopy

Proceedings Article | 15 March 2000 Paper
Chee Tan, John David, J. Clark, Graham Rees, S. Plimmer, David Robbins, David Herbert, Roger Carline, Weng Leong
Proceedings Volume 3953, (2000) https://doi.org/10.1117/12.379602
KEYWORDS: Silicon, Diodes, Ionization, Avalanche photodetectors, Gallium arsenide, Data modeling, Reverse modeling, Doping, Helium neon lasers, Absorption

Proceedings Article | 23 April 1999 Paper
David Robbins, Alan Marrs, Christopher Pickering, Allister Dann, John Glasper, John Russell
Proceedings Volume 3742, (1999) https://doi.org/10.1117/12.346246
KEYWORDS: Semiconducting wafers, Silicon, Sensors, Germanium, Ellipsometry, Temperature metrology, Particle filters, Optical properties, Systems modeling, Semiconductors

Proceedings Article | 19 March 1999 Paper
David Robbins, John Glasper, Carl Anthony, Michael Uren, Roger Carline, David Herbert, Weng Leong
Proceedings Volume 3630, (1999) https://doi.org/10.1117/12.342779
KEYWORDS: Sensors, Quantum well infrared photodetectors, Quantum wells, Capacitors, CMOS sensors, Silicon, Black bodies, Transistors, Temperature metrology, Infrared sensors

Proceedings Article | 25 April 1997 Paper
Roger Carline, D. Hope, Mark Stanaway, David Robbins
Proceedings Volume 3007, (1997) https://doi.org/10.1117/12.273839
KEYWORDS: Silicon, Semiconducting wafers, Temperature metrology, Sensors, Oxides, Quantum well infrared photodetectors, Pyrometry, Photodetectors, Spectroscopic ellipsometry, Absorption

Showing 5 of 10 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 1 July 2004

SPIE Conference Volume | 30 May 2003

SPIE Conference Volume | 27 March 2002

SPIE Conference Volume | 18 May 2001

SPIE Conference Volume | 15 March 2000

Conference Committee Involvement (9)
Silicon Photonics II
22 January 2007 | San Jose, California, United States
Silicon Photonics
25 January 2006 | San Jose, California, United States
Optoelectronic Integration on Silicon III
25 January 2005 | San Jose, California, United States
Optoelectronic Integration on Silicon II
27 January 2004 | San Jose, CA, United States
Emerging Optoelectronic Applications
26 January 2004 | San Jose, CA, United States
Showing 5 of 9 Conference Committees
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