Dr. David W. Schiering
Principal at Czitek LLC
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | April 28, 2010
Proc. SPIE. 7680, Next-Generation Spectroscopic Technologies III
KEYWORDS: FT-IR spectroscopy, Carbon dioxide, Sensors, Calibration, Spectroscopy, Molecules, Hydrogen, Infrared radiation, Toxic industrial chemicals, Absorption

PROCEEDINGS ARTICLE | December 16, 2004
Proc. SPIE. 5585, Chemical and Biological Point Sensors for Homeland Defense II
KEYWORDS: FT-IR spectroscopy, Proteins, Principal component analysis, Data modeling, Pattern recognition, Spectroscopy, Infrared spectroscopy, Field spectroscopy, Spectroscopes, Statistical modeling

PROCEEDINGS ARTICLE | March 8, 2004
Proc. SPIE. 5269, Chemical and Biological Point Sensors for Homeland Defense
KEYWORDS: Infrared sensors, Diamond, FT-IR spectroscopy, Weapons of mass destruction, Sensors, Spectroscopy, Computing systems, Integration, Michelson interferometers

PROCEEDINGS ARTICLE | January 31, 1994
Proc. SPIE. 2089, 9th International Conference on Fourier Transform Spectroscopy
KEYWORDS: Tissues, Spectroscopy, Medical research, Imaging spectroscopy, Infrared spectroscopy, Latex, Infrared radiation, Brain mapping, Absorption, Brain

Conference Committee Involvement (10)
Next-Generation Spectroscopic Technologies XI
16 April 2018 | Orlando, Florida, United States
Next-Generation Spectroscopic Technologies X
10 April 2017 | Anaheim, California, United States
Next-Generation Spectroscopic Technologies IX
18 April 2016 | Baltimore, Maryland, United States
Next-Generation Spectroscopic Technologies VIII
20 April 2015 | Baltimore, Maryland, United States
Next-Generation Spectroscopic Technologies VII
5 May 2014 | Baltimore, Maryland, United States
Showing 5 of 10 published special sections
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