Dr. David J. Smith
at GE Global Research
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019
Proc. SPIE. 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI
KEYWORDS: Cadmium, Sensors, Crystals, X-rays, Zinc, Doping, Chemical analysis, Selenium, Semiconducting wafers, X-ray detectors

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