Dr. David D. Smith
Research Scientist at NASA
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

Proceedings Article | 21 February 2014
Proc. SPIE. 8998, Advances in Slow and Fast Light VII
KEYWORDS: Signal to noise ratio, Superposition, Polarization, Dispersion, Reflectivity, Wave plates, Optical resonators, Liquid crystals, Computer aided design, Absorption

Proceedings Article | 6 March 2013
Proc. SPIE. 8636, Advances in Slow and Fast Light VI
KEYWORDS: Mirrors, Dispersion, Reflectivity, Solids, Optical resonators, Transmittance, Laser optics, Resonance enhancement, Phase shifts, Absorption

Proceedings Article | 8 February 2012
Proc. SPIE. 8273, Advances in Slow and Fast Light V
KEYWORDS: Fabry–Perot interferometers, Slow light, Doppler effect, Dispersion, Optical resonators, Gyroscopes, Optical pumping, Laser beam diagnostics, Resonance enhancement, Absorption

Proceedings Article | 14 February 2007
Proc. SPIE. 6452, Laser Resonators and Beam Control IX
KEYWORDS: Optical filters, Modulation, Resonators, Chemical species, Phase shift keying, Optical resonators, Gyroscopes, Chemical elements, Phase shifts, Absorption

Proceedings Article | 21 September 2005
Proc. SPIE. 5912, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials II
KEYWORDS: Slow light, Resonators, Scattering, Chemical species, Photons, Laser scattering, Laser resonators, Gyroscopes, Pulsed laser operation, Absorption

Showing 5 of 9 publications
Conference Committee Involvement (9)
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
1 February 2020 | San Francisco, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
15 February 2016 | San Francisco, California, United States
Showing 5 of 9 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top