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David Thomson
at Univ of Strathclyde
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Publications (1)
Proceedings Article | 10 March 2020 Presentation
Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation)
Carol Trager-Cowan, Aeshah Alasmari, William Avis, Jochen Bruckbauer, Paul Edwards, Ben Hourahine, Albes Kotzai, Gunnar Kusch, Robert Martin, Ryan McDermott, G. Naresh-Kumar, M. Nouf-Allehiani, Elena Pascal, David Thomson, Dale Waters, Peter Parbrook, Arantxa Vilalta-Clemente, Angus Wilkinson, Ken Mingard, Aimo Winkelmann
Proceedings Volume 11280, 1128008 (2020) https://doi.org/10.1117/12.2544228
KEYWORDS: Semiconductors, Visualization, Scanning electron microscopy, Diffraction, Crystals, Gallium nitride, Nondestructive evaluation, Electron beams, Backscatter, Hyperspectral imaging
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