David Willenborg
Vice President/Engineering
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 March 1994
Proc. SPIE. 2004, Interferometry VI: Applications
KEYWORDS: Semiconductors, Oxides, Thin films, Polarization, Sensors, Calibration, Silicon, Reflectivity, Interferometry, Phase measurement

Proceedings Article | 1 January 1992
Proc. SPIE. 1594, Process Module Metrology, Control and Clustering
KEYWORDS: Microscopes, Refractive index, Sensors, Dielectrics, Optical testing, Reflectometry, Process control, Objectives, Spectrophotometry, Semiconducting wafers

Proceedings Article | 1 January 1992
Proc. SPIE. 1594, Process Module Metrology, Control and Clustering
KEYWORDS: Oxides, Scattering, Dielectrics, Light scattering, Laser scattering, Reflectivity, Reflectometry, Process control, Spectrophotometry, Semiconducting wafers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top