David A. Wyndham
at Univ of Western Australia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 December 2008
Proc. SPIE. 7267, Smart Materials V
KEYWORDS: Silicon, Refractive index, Silicon films, Semiconducting wafers, Reflectivity, Etching, Data modeling, Scanning electron microscopy, Semiconductor lasers, Doping

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