Davide Bianchi
Young Scientist at AC2T Research GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2010 Paper
D. Bianchi, A. Vernes, G. Vorlaufer, G. Betz
Proceedings Volume 7718, 77180I (2010) https://doi.org/10.1117/12.854498
KEYWORDS: Wavelets, Confocal microscopy, Microscopes, Gaussian filters, Wavelet transforms, Fast wavelet transforms, Analytical research, Image analysis, Applied physics, Standards development

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