Dr. Davood Khodadad
Ph.D at Luleå Univ of Technology
SPIE Involvement:
Profile Summary

I received my B.S and M.S. degree in Bioelectrical Engineering from Sahand University of Technology, Tabriz, and Tehran University of Medical Sciences, Tehran, in 2008 and 2011, respectively. I was active as a PhD student in the division of Experimental Mechanics at Luleå University of Technology, Sweden during the years 2012-1016. I focused on the development of multispectral and dual-polarization Digital Holography for three-dimensional imaging. In 2016, I moved to Waves and Signals research group at Linnaeus University to focus on the development of Electrical Impedance Tomography (EIT) and Diffusion-based Optical Tomography. My research interests include non-contact optical metrology, imaging and image formation, signal and image processing.
Publications (5)

Proceedings Article | 24 August 2015
Proc. SPIE. 9660, SPECKLE 2015: VI International Conference on Speckle Metrology
KEYWORDS: Mirrors, Beam splitters, Holography, Digital holography, Polarization, Sensors, Calibration, Magnetism, Multiplexing, Jones vectors

Proceedings Article | 18 August 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Chromatic aberrations, Beam splitters, Holograms, Digital holography, Spatial frequencies, Speckle, Sensors, Calibration, Wave propagation, Environmental sensing

SPIE Journal Paper | 28 June 2013
OE Vol. 52 Issue 10
KEYWORDS: Speckle, Digital holography, Holography, Holograms, Speckle pattern, Sensors, Phase measurement, Scattering, Wave propagation, Optical engineering

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Beam splitters, Holograms, Digital holography, Speckle, Sensors, Interferometry, Phase interferometry, Speckle pattern, Wave propagation, Distance measurement

Proceedings Article | 25 September 2012
Proc. SPIE. 8413, Speckle 2012: V International Conference on Speckle Metrology
KEYWORDS: Metrology, Digital holography, Imaging systems, Spatial frequencies, Speckle, Scattering, Sensors, Interferometry, Speckle pattern, Phase measurement

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