Davy Hollevoet
at Univ Gent
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Profilometers, Forensic science, Temperature metrology, Image processing, Image segmentation, Bismuth, Dielectrophoresis, Digital imaging, Metals, Chromatic aberrations

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