Mr. Deepak Giri
Graduate Student at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
KEYWORDS: Imaging systems, Cameras, Image processing, Inspection, Clouds, Data processing, Aluminum, Epoxies, Surface finishing, 3D image processing

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