Dr. Deniz Sabuncuoglu Tezcan
at imec
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 29 May 2024 Presentation
Proceedings Volume 13083, 1308310 (2024) https://doi.org/10.1117/12.3022596
KEYWORDS: Short wave infrared radiation, Photodiodes, Thin films, Infrared radiation, Quantum sensing, Quantum imaging, Polarization, Infrared sensors, Infrared photography, Optical properties

Proceedings Article | 28 March 2021 Presentation
Xavier Rottenberg, Denis Marcon, Roelof Jansen, Bruno Figeys, Kristof Lodewijks, Anabel De Proft, Philippe Helin, Veronique Rochus, Cedric Rolin, Eleonora Storace, Robert Gehlhaar, Jan Genoe, Haris Osman, Paul Heremans, Philippe Soussan, Sandeep Saseendran, Aleksandrs Marinins, Bart Vereecke, Nga Pham, Deniz Tezcan
Proceedings Volume 11765, 117650G (2021) https://doi.org/10.1117/12.2584260
KEYWORDS: Visible radiation, Near infrared, Wafer-level optics, Sensing systems, Waveguides, Structured light, Scanners, Reflectivity, Quartz, Plasmonics

Proceedings Article | 5 March 2021 Poster + Presentation
Anabel De Proft, Kristof Lodewijks, Nga Pham, Bart Vereecke, Niels Verellen, Roelof Jansen, Deniz Sabuncuoglu Tezcan, Pol Van Dorpe, Xavier Rottenberg
Proceedings Volume 11694, 1169422 (2021) https://doi.org/10.1117/12.2583081
KEYWORDS: Optical filters, Plasmonics, Aluminum, Wave propagation interference, Visible radiation, Surface plasmon polaritons, Silicon, Nanostructuring, Manufacturing, Magnetism

Proceedings Article | 17 November 2017 Open Access Paper
K. Minoglou, D. San Segundo Bello, D. Sabuncuoglu Tezcan, L. Haspeslagh, J. Van Olmen, B. Merry, C. Cavaco, F. Mazzamuto, I. Toqué-Trésonne, R. Moirin, M. Brouwer, M. Toccafondi, G. Preti, M. Rosmeulen, P. De Moor
Proceedings Volume 10563, 1056304 (2017) https://doi.org/10.1117/12.2304233
KEYWORDS: Semiconducting wafers, Silicon, Imaging systems, Image processing, Antireflective coatings, Annealing, Astronomical imaging, Analog electronics, Coating, Optical amplifiers

Proceedings Article | 3 October 2011 Paper
Proceedings Volume 8176, 81761D (2011) https://doi.org/10.1117/12.901234
KEYWORDS: Imaging systems, Quantum efficiency, Semiconducting wafers, Sensors, Silicon, Metals, Aluminum, Modulation transfer functions, Indium, Detector arrays

Showing 5 of 8 publications
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