Dennis Brückner
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Beryllium, X-rays, X-ray microscopy, Microscopy, X-ray optics, Tomography, Hard x-rays, Spatial resolution, Lenses

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Sensors, Microscopes, Signal detection, Laser scattering, Scanners, Nitrogen

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