Dennis A. Margosan
Plant Pathologist at USDA Agricultural Research Service
SPIE Involvement:
Conference Program Committee | Symposium Committee
Conference Committee Involvement (3)
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
26 April 2011 | Orlando, Florida, United States
Scanning Microscopy 2010
17 May 2010 | Monterey, California, United States
SPIE Scanning Microscopy
4 May 2009 | Monterey, United States
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