Dr. Derek J. Walvoord
at Exelis Geospatial Systems
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | November 27, 2014
OE Vol. 53 Issue 11
KEYWORDS: Cameras, Atomic force microscopy, Clouds, Error analysis, Image processing, Sensors, Global Positioning System, 3D modeling, 3D image processing, Imaging systems

PROCEEDINGS ARTICLE | May 23, 2013
Proc. SPIE. 8747, Geospatial InfoFusion III
KEYWORDS: 3D image reconstruction, Data modeling, Imaging systems, Cameras, Sensors, Matrices, Image processing, Error analysis, Clouds, Atomic force microscopy

PROCEEDINGS ARTICLE | March 18, 2008
Proc. SPIE. 6810, Computer Image Analysis in the Study of Art
KEYWORDS: Visible radiation, Light emitting diodes, Principal component analysis, Sensors, Image processing, Ultraviolet radiation, X-rays, Image registration, Multispectral imaging, X-ray fluorescence spectroscopy

PROCEEDINGS ARTICLE | January 29, 2007
Proc. SPIE. 6500, Document Recognition and Retrieval XIV
KEYWORDS: Data modeling, Pattern recognition, Photography, Image filtering, Mathematics, Associative arrays, Image classification, Optical character recognition, Electronic filtering, Nonlinear filtering

PROCEEDINGS ARTICLE | January 17, 2005
Proc. SPIE. 5676, Document Recognition and Retrieval XII
KEYWORDS: Visible radiation, Spatial filters, Image processing, Ultraviolet radiation, Composites, Feature extraction, Image filtering, Optical character recognition, Nonlinear filtering, Phase only filters

PROCEEDINGS ARTICLE | May 28, 2004
Proc. SPIE. 5298, Image Processing: Algorithms and Systems III
KEYWORDS: Optical filters, Detection and tracking algorithms, Spatial filters, Fourier transforms, Feature extraction, Image filtering, Electronic filtering, Algorithm development, Nonlinear filtering, Signal detection

Showing 5 of 6 publications
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