Dr. Dervis Vernani
Senior Project Manager at Thales Alenia Space Switzerland
SPIE Involvement:
Author
Publications (29)

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10562, International Conference on Space Optics 2016
KEYWORDS: Space telescopes, Telescopes, Mirrors, Optical instrument design, Astronomical imaging, Silver, Optical components, Optical design, Manufacturing, Sensors

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10562, International Conference on Space Optics 2016
KEYWORDS: Sensors, Space telescopes, Telescopes, Point spread functions, Optical filters, Astronomical imaging, Imaging systems, Mars, Mirrors, Staring arrays

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Telescopes, X-ray optics, Silicon, X-ray telescopes, X-ray astronomy, X-rays, High energy astrophysics, Semiconductors, Spatial resolution, Mirrors

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: X-rays, Mirrors, Mirror structures, Optical alignment, Metrology, Titanium, Interfaces, Aluminum, X-ray optics, Manufacturing

PROCEEDINGS ARTICLE | July 29, 2016
Proc. SPIE. 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
KEYWORDS: Space telescopes, Sensors, Imaging systems, Telescopes, Mirrors, Point spread functions, Optical filters, Mars, Image filtering, Near infrared

PROCEEDINGS ARTICLE | July 18, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: X-rays, X-ray optics, X-ray technology, Space telescopes, Silicon, X-ray optics, Telescopes, X-ray technology, Semiconductors, Mirrors, Metrology, Optics manufacturing

Showing 5 of 29 publications
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