Dr. Devendra K. Sadana
Manager at IBM Thomas J Watson Research Ctr
SPIE Involvement:
Fellow status | Conference Chair | Author | Editor
Publications (10)

PROCEEDINGS ARTICLE | March 13, 2015
Proc. SPIE. 9364, Oxide-based Materials and Devices VI
KEYWORDS: Semiconductors, Visible radiation, Light emitting diodes, Graphene, Solid state lighting, Gallium nitride, Silicon carbide, Chemical lasers, Laser liftoff, Blue light emitting diodes

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9370, Quantum Sensing and Nanophotonic Devices XII
KEYWORDS: Visible radiation, Light emitting diodes, Polarization, Ultraviolet radiation, Luminescence, Crystals, Silicon, Semiconductor lasers, Gallium nitride, Light sources and illumination

PROCEEDINGS ARTICLE | June 4, 2014
Proc. SPIE. 9083, Micro- and Nanotechnology Sensors, Systems, and Applications VI
KEYWORDS: Photovoltaics, Solid state lighting, Image processing, Germanium, Nickel, Silicon, Gallium nitride, Sapphire, Semiconducting wafers, Flexible circuits

PROCEEDINGS ARTICLE | March 18, 2013
Proc. SPIE. 8626, Oxide-based Materials and Devices IV
KEYWORDS: Photovoltaics, Light emitting diodes, Crystals, Indium, Silicon, Gallium nitride, Sapphire, Indium gallium nitride, Zinc oxide, Metalorganic chemical vapor deposition

PROCEEDINGS ARTICLE | February 4, 2013
Proc. SPIE. 8631, Quantum Sensing and Nanophotonic Devices X
KEYWORDS: Oxides, Silica, Crystals, Silicon, Scanning electron microscopy, Gallium nitride, Photonics, Aluminum nitride, Epitaxy, Metalorganic chemical vapor deposition

PROCEEDINGS ARTICLE | January 21, 2012
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Oscillators, Polarization, Reliability, Resistance, Electronic components, Gallium nitride, Optoelectronic devices, Diodes, Terahertz radiation, Aluminum

Showing 5 of 10 publications
Conference Committee Involvement (3)
Advanced Processing and Characterization of Semiconductors III
21 January 1986 | Los Angeles, CA, United States
Advanced Applications of Ion Implantation
21 January 1985 | Los Angeles, United States
Advanced Semiconductor Processing/Characterization of Electronic/Optical Materials
24 January 1984 | Los Angeles, United States
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