Dr. Devendra K. Sadana
Manager at IBM Thomas J Watson Research Ctr
SPIE Involvement:
Fellow status | Conference Chair | Author
Publications (10)

PROCEEDINGS ARTICLE | March 13, 2015
Proc. SPIE. 9364, Oxide-based Materials and Devices VI
KEYWORDS: Light emitting diodes, Gallium nitride, Graphene, Silicon carbide, Blue light emitting diodes, Visible radiation, Solid state lighting, Laser liftoff, Semiconductors, Chemical lasers

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9370, Quantum Sensing and Nanophotonic Devices XII
KEYWORDS: Gallium nitride, Silicon, Ultraviolet radiation, Light emitting diodes, Visible radiation, Luminescence, Crystals, Semiconductor lasers, Light sources and illumination, Polarization

PROCEEDINGS ARTICLE | June 4, 2014
Proc. SPIE. 9083, Micro- and Nanotechnology Sensors, Systems, and Applications VI
KEYWORDS: Nickel, Silicon, Gallium nitride, Flexible circuits, Semiconducting wafers, Germanium, Image processing, Photovoltaics, Sapphire, Solid state lighting

PROCEEDINGS ARTICLE | March 18, 2013
Proc. SPIE. 8626, Oxide-based Materials and Devices IV
KEYWORDS: Gallium nitride, Silicon, Zinc oxide, Light emitting diodes, Indium gallium nitride, Crystals, Photovoltaics, Sapphire, Indium, Metalorganic chemical vapor deposition

PROCEEDINGS ARTICLE | February 4, 2013
Proc. SPIE. 8631, Quantum Sensing and Nanophotonic Devices X
KEYWORDS: Gallium nitride, Silicon, Metalorganic chemical vapor deposition, Oxides, Epitaxy, Scanning electron microscopy, Silica, Crystals, Photonics, Aluminum nitride

PROCEEDINGS ARTICLE | January 21, 2012
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Gallium nitride, Resistance, Terahertz radiation, Diodes, Aluminum, Reliability, Oscillators, Electronic components, Optoelectronic devices, Polarization

Showing 5 of 10 publications
Conference Committee Involvement (3)
Advanced Processing and Characterization of Semiconductors III
21 January 1986 | Los Angeles, CA, United States
Advanced Applications of Ion Implantation
21 January 1985 | Los Angeles, United States
Advanced Semiconductor Processing/Characterization of Electronic/Optical Materials
24 January 1984 | Los Angeles, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top