Di Wu
at Univ of Science and Technology Beijing
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 January 2008
Proc. SPIE. 6829, Advanced Materials and Devices for Sensing and Imaging III
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Calibration, Distortion, 3D modeling, Optical testing, 3D metrology, Coded apertures, Structured light

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