Didier Perion
at Detection Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 May 2017 Presentation + Paper
Caroline Paulus, Vincent Moulin, Didier Perion, Patrick Radisson, Loïck Verger
Proceedings Volume 10187, 101870I (2017) https://doi.org/10.1117/12.2262585
KEYWORDS: Sensors, X-ray detectors, X-rays, Dual energy imaging, Spectroscopy, Sensor performance, Calibration, Inspection, Photon counting, Polymethylmethacrylate, Aluminum, Superposition, Error analysis

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