Prof. Dietmar Knipp Profile

Prof. Dietmar Knipp

at Jacobs Univ Bremen

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 27 May 2011 Paper

Measurements of aberrations of aspherical lenses using experimental ray tracing

Ufuk Ceyhan, Thomas Henning, Friedrich Fleischmann, David Hilbig, Dietmar Knipp

Proceedings Volume 8082, 80821K (2011) https://doi.org/10.1117/12.895009

KEYWORDS: Aspheric lenses, Ray tracing, Wavefront aberrations, Profilometers, Wavefronts, Optical design, Refractive index, Optical testing, Optical components, Refraction

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Proceedings Article | 17 June 2009 Paper

Inspection of aspherical lenses by wavefront analysis

Ufuk Ceyhan, Thomas Henning, Friedrich Fleischmann, Dietmar Knipp

Proceedings Volume 7389, 73893L (2009) https://doi.org/10.1117/12.834224

KEYWORDS: Wavefronts, Aspheric lenses, Monochromatic aberrations, Sensors, Light sources, Zernike polynomials, Inspection, Wavefront analysis, Optical aberrations, Cameras

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Proceedings Article | 21 January 2003 Paper

Thin-film-technology-based micro-Fourier spectrometer

Dietmar Knipp, Helmut Stiebig, Sameer Bhalotra, Helen Kung, David Miller

Proceedings Volume 4983, (2003) https://doi.org/10.1117/12.477919

KEYWORDS: Sensors, Spectroscopy, Mirrors, Modulation, Amorphous silicon, Photoresistors, Absorption, Reflection, Glasses, Thin films

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Proceedings Article | 21 December 2001 Paper

Influence of the gate dielectric on the morphological and electronic structure of pentacene films for transistor applications

Dietmar Knipp, Robert Street, Brent Krusor, Raj Apte, Jackson Ho

Proceedings Volume 4466, (2001) https://doi.org/10.1117/12.451473

KEYWORDS: Silicon, Oxides, Silicon films, Dielectrics, Crystals, Transistors, Thin films, Amorphous silicon, Chemical vapor deposition, X-ray diffraction

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Proceedings Article | 15 May 2001 Paper

Thin film color sensors in multichannel technology

Dietmar Knipp, Helmut Stiebig, Heribert Wagner

Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426950

KEYWORDS: Sensors, Diodes, Absorption, Thin films, Photons, Switching, Transparent conductors, Amorphous silicon, Signal detection, Optical filters

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Proceedings Article | 21 December 1999 Paper

Performance of amorphous-silicon-based multiple-channel color sensors

Patrick Herzog, Dietmar Knipp, Friedhelm Koenig, Helmut Stiebig

Proceedings Volume 3963, (1999) https://doi.org/10.1117/12.373439

KEYWORDS: Sensors, Computer programming, Diodes, Thin films, Sensor performance, Absorption, Transparent conductors, Matrices, Amorphous silicon, Thin film manufacturing

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SPIE Journal Paper | 1 October 1999

Colorimetric characterization of novel multiple-channel sensors for imaging and metrology

Patrick Herzog, Dietmar Knipp, Helmut Stiebig, Friedhelm Koenig

JEI, Vol. 8, Issue 04, (October 1999) https://doi.org/10.1117/12.10.1117/1.482704

KEYWORDS: Sensors, Cameras, CCD image sensors, Crystals, CCD cameras, Diodes, Transparent conductors, Amorphous silicon, Electronics, Measurement devices