Dr. Dingquan Liu
Prof. at Shanghai Institute of Technical Physics
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
KEYWORDS: Oscillators, Optical properties, Reflection, Metals, Copper, Dielectrics, Silver, Reflectivity, Transmittance, Aluminum

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation

PROCEEDINGS ARTICLE | December 16, 2013
Proc. SPIE. 9068, Eighth International Conference on Thin Film Physics and Applications
KEYWORDS: Thin films, Argon, Sputter deposition, Solar cells, Interfaces, Resistance, Thin film solar cells, Sodium, Molybdenum, Copper indium gallium selenide

PROCEEDINGS ARTICLE | October 16, 2012
Proc. SPIE. 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Thin films, Refractive index, Germanium, X-ray diffraction, Silicon, Atomic force microscopy, Scanning electron microscopy, Silicon films, Deposition processes, Thin film deposition

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
KEYWORDS: Thin films, Refractive index, Visible radiation, Optical properties, Germanium, Reflectivity, Zinc, Scanning electron microscopy, Spectroscopic ellipsometry, Temperature metrology

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
KEYWORDS: Infrared sensors, Near infrared, Thin films, Optical filters, Refractive index, Fabry–Perot interferometers, FT-IR spectroscopy, Sensors, Annealing, Image filtering

Showing 5 of 14 publications
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