Dr. Dirk Isfort
at Carl Zeiss Jena GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9131, Optical Modelling and Design III
KEYWORDS: Refractive index, Multilayers, Data modeling, Titanium dioxide, Silica, Sputter deposition, Ions, Optical coatings, Thin film coatings, Plasma

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